Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM) is a powerful microscope capable of extremely high magnifications far beyond what can be achieved with a traditional light microscope. All types of dry sample can be imaged, and gold/carbon coating is available for specimens that are not electrically conductive. In addition to high magnification imaging, this SEM is equipped for Energy-dispersive X-ray spectroscopy (EDX). This is an analytical technique used for the elemental analysis of a sample and can be used to map the elemental composition of the surface or cross-section of a specimen.