Abstract
For the electromagnetic eddy current (EC) testing, various methods have been proposed for reducing the lift-off error on the measurement of samples. In this article, instead of eliminating the measurement error caused by the lift-off effect, an algorithm has been proposed to directly measure the lift-off distance between the sensor and nonmagnetic conductive plates. The algorithm is based on a sample-independent inductance (SII) feature. That is, under high working frequencies, the inductance is found to be sensitive to the lift-off distance and independent of the test piece under an optimal single high working frequency (43.87 kHz). Furthermore, the predicted lift-off distance is used for the thickness prediction of the nonmagnetic conductive samples using an iterative method. Considering the EC skin depth, the thickness prediction is operated under a single lower frequency (0.20 kHz). As the inductance has different sensitivities to the lift-off and thickness, the prediction error of the sample thickness is different from that of the lift-off distance. From the experiments on three different nonmagnetic samples - aluminum, copper, and brass, the maximum prediction error of the lift-off distance and sample thickness is 1.1 mm and 5.42%, respectively, at the lift-off of 12.0 mm.
Original language | English |
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Pages (from-to) | 1 - 8 |
Number of pages | 8 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 70 |
Early online date | 24 Nov 2020 |
DOIs | |
Publication status | E-pub ahead of print - 24 Nov 2020 |
Keywords
- Eddy current sensor
- lift-off measurement
- thickness measurement
- non-destructive testing
- sample-independence
- Electrical and Electronic Engineering
- Instrumentation
- nondestructive testing (NDT)
- sample independence
- Eddy current (EC) sensor