@inbook{ceb5dac216734719bc14b1555b7001e8,
title = "Magnetic imaging of nanostructured magnetic elements",
abstract = "Ferromagnetic elements with dimensions in the micron and sub-micron size regime are under extensive investigation as miniature sensor and storage elements. The elements themselves can be pattemed from single layer or multilayer films, there being much current interest in the properties of spin-valve (SV) and spin-tunnel junction (STJ) elements. Properties of the elements differ significantly according to their shape and size as well as from any additional magnetostatic coupling between layers due to stray fields arising from magnetic charges at the edges of, for example, pinned layers in a multilayer stack. We use differential phase contrast (DPC) imaging in a transmission electron microscope (EM) to observe directly the magnetisation distributions in small elements and to study how they evolve under the application of an applied field{\textquoteright},{\textquoteright}. DPC imaging offers high spatial resolution and reveals stray fields outside the elements as well as the induction distribution within them",
author = "J.N. Chapman and P.R. Aitchison and K.J. Kirk and S. McVitie",
year = "2000",
doi = "10.1109/INTMAG.2000.872096",
language = "English",
isbn = "0-7803-5943-7",
series = " IEEE International Magnetics Conference",
publisher = "IEEE",
booktitle = "2000 IEEE International Magnetics Conference (INTERMAG)",
}