MFM imaging of patterned permalloy elements under an external applied field

J.M. Garcı́a; A. Thiaville; J. Miltat; K.J. Kirk; J.N. Chapman

doi:10.1016/S0304-8853(01)01027-7

MFM imaging of patterned permalloy elements under an external applied field

J.M. Garcı́a
, A. Thiaville
, J. Miltat
, K.J. Kirk
, J.N. Chapman

School of Technology

Research output: Contribution to Journal › Article › peer-review

Abstract

The magnetization process of micron-sized permalloy elements submitted to in-plane magnetic fields is analyzed by means of magnetic force microscopy (MFM). Depending on the magnetic history of the sample and on the value of the applied field, high remanence domain structures (the so-called S- and C-states) as well as flux closure configurations (Landau and diamond patterns) are observed. Perturbations induced by the MFM tip are found, and the results are discussed with the help of micromagnetic simulations.

Original language	English
Pages (from-to)	1267-1269
Number of pages	2
Journal	Journal of Magnetism and Magnetic Materials
Volume	242-245
Issue number	2
DOIs	https://doi.org/10.1016/S0304-8853(01)01027-7
Publication status	Published - 1 Apr 2002

Keywords

Magnetic force microscopy
Micromagnetic calculations
Permalloy
Domain structure

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title = "MFM imaging of patterned permalloy elements under an external applied field",

abstract = "The magnetization process of micron-sized permalloy elements submitted to in-plane magnetic fields is analyzed by means of magnetic force microscopy (MFM). Depending on the magnetic history of the sample and on the value of the applied field, high remanence domain structures (the so-called S- and C-states) as well as flux closure configurations (Landau and diamond patterns) are observed. Perturbations induced by the MFM tip are found, and the results are discussed with the help of micromagnetic simulations.",

keywords = "Magnetic force microscopy, Micromagnetic calculations, Permalloy, Domain structure",

author = "J.M. Garc{\'ı}a and A. Thiaville and J. Miltat and K.J. Kirk and J.N. Chapman",

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doi = "10.1016/S0304-8853(01)01027-7",

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TY - JOUR

T1 - MFM imaging of patterned permalloy elements under an external applied field

AU - Garcı́a, J.M.

AU - Thiaville, A.

AU - Miltat, J.

AU - Kirk, K.J.

AU - Chapman, J.N.

PY - 2002/4/1

Y1 - 2002/4/1

N2 - The magnetization process of micron-sized permalloy elements submitted to in-plane magnetic fields is analyzed by means of magnetic force microscopy (MFM). Depending on the magnetic history of the sample and on the value of the applied field, high remanence domain structures (the so-called S- and C-states) as well as flux closure configurations (Landau and diamond patterns) are observed. Perturbations induced by the MFM tip are found, and the results are discussed with the help of micromagnetic simulations.

AB - The magnetization process of micron-sized permalloy elements submitted to in-plane magnetic fields is analyzed by means of magnetic force microscopy (MFM). Depending on the magnetic history of the sample and on the value of the applied field, high remanence domain structures (the so-called S- and C-states) as well as flux closure configurations (Landau and diamond patterns) are observed. Perturbations induced by the MFM tip are found, and the results are discussed with the help of micromagnetic simulations.

KW - Magnetic force microscopy

KW - Micromagnetic calculations

KW - Permalloy

KW - Domain structure

U2 - 10.1016/S0304-8853(01)01027-7

DO - 10.1016/S0304-8853(01)01027-7

M3 - Article

SN - 0304-8853

VL - 242-245

SP - 1267

EP - 1269

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 2

ER -

MFM imaging of patterned permalloy elements under an external applied field

Abstract

Keywords

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