Protection of Memory Using Code Redundancies: A Brief Study

Raghad Zenki, Michael Opoku Agyeman

Research output: Contribution to conference typesPaperResearchpeer-review

Abstract

Experimental results have shown that the Neutron and proton induced upset is the root cause of increasing the sensitivity of microelectronics to soft errors. Thus eliminating these errors are the main challenge to overcome while designing and implementing any microelectronic device, error detection and correction technologies are practical ways that could be applied to fulfill such a purpose. Hamming code, Reed-Solomon codes, Parity Matrix codes, and many more techniques, have been developed and used over the last decades targeting memory protection. Which are still delivering qualified performance measures; however, the downside of these approaches is that they necessitate more redundant memory space, transmission delay, and sophisticated reliability architecture. This paper highlights various memory protection technologies, particularly emphasizing on The Decimal matrix code (DMC) with Encoder Reuse Technique (ERT).
Original languageEnglish
Publication statusAccepted/In press - 9 Apr 2019
EventInternational Symposium on Computer Science and Intelligent Control - Netherlands, Amsterdam, Netherlands
Duration: 25 Sep 201927 Sep 2019
http://www.iscsic.org/

Conference

ConferenceInternational Symposium on Computer Science and Intelligent Control
Abbreviated titleISCSIC 2019
CountryNetherlands
CityAmsterdam
Period25/09/1927/09/19
Internet address

Fingerprint

Redundancy
Data storage equipment
Microelectronics
Reed-Solomon codes
Error detection
Error correction
Neutrons
Protons

Cite this

Zenki, R., & Opoku Agyeman, M. (Accepted/In press). Protection of Memory Using Code Redundancies: A Brief Study. Paper presented at International Symposium on Computer Science and Intelligent Control, Amsterdam, Netherlands.
Zenki, Raghad ; Opoku Agyeman, Michael. / Protection of Memory Using Code Redundancies: A Brief Study. Paper presented at International Symposium on Computer Science and Intelligent Control, Amsterdam, Netherlands.
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Zenki, R & Opoku Agyeman, M 2019, 'Protection of Memory Using Code Redundancies: A Brief Study' Paper presented at International Symposium on Computer Science and Intelligent Control, Amsterdam, Netherlands, 25/09/19 - 27/09/19, .

Protection of Memory Using Code Redundancies: A Brief Study. / Zenki, Raghad; Opoku Agyeman, Michael.

2019. Paper presented at International Symposium on Computer Science and Intelligent Control, Amsterdam, Netherlands.

Research output: Contribution to conference typesPaperResearchpeer-review

TY - CONF

T1 - Protection of Memory Using Code Redundancies: A Brief Study

AU - Zenki, Raghad

AU - Opoku Agyeman, Michael

PY - 2019/4/9

Y1 - 2019/4/9

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AB - Experimental results have shown that the Neutron and proton induced upset is the root cause of increasing the sensitivity of microelectronics to soft errors. Thus eliminating these errors are the main challenge to overcome while designing and implementing any microelectronic device, error detection and correction technologies are practical ways that could be applied to fulfill such a purpose. Hamming code, Reed-Solomon codes, Parity Matrix codes, and many more techniques, have been developed and used over the last decades targeting memory protection. Which are still delivering qualified performance measures; however, the downside of these approaches is that they necessitate more redundant memory space, transmission delay, and sophisticated reliability architecture. This paper highlights various memory protection technologies, particularly emphasizing on The Decimal matrix code (DMC) with Encoder Reuse Technique (ERT).

M3 - Paper

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Zenki R, Opoku Agyeman M. Protection of Memory Using Code Redundancies: A Brief Study. 2019. Paper presented at International Symposium on Computer Science and Intelligent Control, Amsterdam, Netherlands.