Radon track imaging in CR-39 plastic detectors using confocal scanning laser microscopy

Nick Petford, D. Wertheim, J. A. Miller

Research output: Contribution to journalArticle

Abstract

Confocal scanning laser microscopy (CSLM) has been used to provide the first images of radon track populations in two external CR-39 plastic detectors. Measurements of variables including track area distribution and estimates of the angle of track inclination (dip) derived from surface CSLM sections are presented. CSLM depth slices, combined with three-dimensional (3D) visualization techniques, provide a new, non-destructive way of examining the 2D and 3D geometry of the etched tracks within solid-state nuclear track detectors that may prove useful in complementing existing optical microscopy methods.
Original languageEnglish
Pages (from-to)179-183
Number of pages5
JournalJournal of Microscopy
Volume217
Issue number3
DOIs
Publication statusPublished - 22 Feb 2005

Fingerprint

laser microscopy
radon
plastics
scanning
detectors
inclination
microscopy
solid state
estimates
geometry

Keywords

  • Confocal microscopy
  • Etching
  • Image processing
  • Radon
  • Track detectors

Cite this

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abstract = "Confocal scanning laser microscopy (CSLM) has been used to provide the first images of radon track populations in two external CR-39 plastic detectors. Measurements of variables including track area distribution and estimates of the angle of track inclination (dip) derived from surface CSLM sections are presented. CSLM depth slices, combined with three-dimensional (3D) visualization techniques, provide a new, non-destructive way of examining the 2D and 3D geometry of the etched tracks within solid-state nuclear track detectors that may prove useful in complementing existing optical microscopy methods.",
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Radon track imaging in CR-39 plastic detectors using confocal scanning laser microscopy. / Petford, Nick; Wertheim, D.; Miller, J. A.

In: Journal of Microscopy, Vol. 217, No. 3, 22.02.2005, p. 179-183.

Research output: Contribution to journalArticle

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AU - Petford, Nick

AU - Wertheim, D.

AU - Miller, J. A.

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KW - Etching

KW - Image processing

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